Compendium Of Surface And Interface Analysis


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Compendium of Surface and Interface Analysis


Compendium of Surface and Interface Analysis

Author: The Surface Science Society of Japan

language: en

Publisher: Springer

Release Date: 2018-02-19


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This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.

Handbook of Surface and Interface Analysis


Handbook of Surface and Interface Analysis

Author: John C. Riviere

language: en

Publisher: CRC Press

Release Date: 2009-06-24


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The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear

Scanning Electron Microscopy


Scanning Electron Microscopy

Author: Ludwig Reimer

language: en

Publisher: Springer

Release Date: 2013-11-11


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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.