Tolerance Design Of Electronic Circuits


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Tolerance Design of Electronic Circuits


Tolerance Design of Electronic Circuits

Author: Robert Spence

language: en

Publisher: World Scientific

Release Date: 1997


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Tolerance design techniques are playing an increasingly important role in maximizing the manufacturing yield of mass-produced electronic circuits. Tolerance Design of Electronic Circuits presents an account of design and analysis methods used to minimize the unwanted effects of component tolerances.Highlights of the book include? An overview of the concepts of Tolerance Analysis and Design? A detailed discussion of the Statistical Exploration Approach to tolerance design? An engineering discussion of the Monte Carlo statistical method? A presentation of several successful examples of the application of tolerance designThis book will be highly appropriate for professional Electronic Circuit Designers, Computer Aided Design Specialists, Electronic Engineering undergraduates and graduates taking courses in Advanced Electronic Circuit Design.

Tolerance Analysis and Design of Electronic Circuits


Tolerance Analysis and Design of Electronic Circuits

Author: Huan Qun Zheng

language: en

Publisher:

Release Date: 1997


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Tolerance Analysis of Electronic Circuits Using MATHCAD


Tolerance Analysis of Electronic Circuits Using MATHCAD

Author: Robert Boyd

language: en

Publisher: CRC Press

Release Date: 1999-09-24


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Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCADä offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including: worst-case analysis, limits for production testing, component stress analysis, determining if a design meets specification limits, and manufacturing yield analysis Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.