Surface Infrared And Raman Spectroscopy

Surface Infrared and Raman Spectroscopy

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

Surface Infrared and Raman Spectroscopy

Surface-Enhanced Vibrational Spectroscopy

Surface Enhanced Vibrational Spectroscopy (SEVS) has reached maturity as an analytical technique, but until now there has been no single work that describes the theory and experiments of SEVS. This book combines the two important techniques of surface-enhanced Raman scattering (SERS) and surface-enhanced infrared (SEIR) into one text that serves as the definitive resource on SEVS. Discusses both the theory and the applications of SEVS and provides an up-to-date study of the state of the art Offers interpretations of SEVS spectra for practicing analysts Discusses interpretation of SEVS spectra, which can often be very different to the non-enhanced spectrum - aids the practicing analyst