Scanning Probe Microscopies Beyond Imaging


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Scanning Probe Microscopies Beyond Imaging


Scanning Probe Microscopies Beyond Imaging

Author: Paolo Samorì

language: en

Publisher: John Wiley & Sons

Release Date: 2006-08-21


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This first book to focus on the use of SPMs to actively manipulate molecules and nanostructures on surfaces goes way beyond conventional treatments of scanning microscopy merely for imaging purposes. It reviews recent progress in the use of SPMs on such soft materials as polymers, with a particular emphasis on chemical discrimination, mechanical properties, tip-induced reactions and manipulations, as well as their nanoscale electrical properties. Detailing the practical application potential of this hot topic, this book is of great interest to specialists of wide-ranging disciplines, including physicists, chemists, materials scientists, spectroscopy experts, surface scientists, and engineers.

Scanning Transmission Electron Microscopy


Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook

language: en

Publisher: Springer Science & Business Media

Release Date: 2011-03-24


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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Scanning Probe Microscopy of Soft Matter


Scanning Probe Microscopy of Soft Matter

Author: Vladimir V. Tsukruk

language: en

Publisher: John Wiley & Sons

Release Date: 2012-01-09


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Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors