Ridge Functions


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Ridge Functions


Ridge Functions

Author: Allan Pinkus

language: en

Publisher: Cambridge University Press

Release Date: 2015-08-07


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Presents the state of the art in the theory of ridge functions, providing a solid theoretical foundation.

Ridge Functions and Applications in Neural Networks


Ridge Functions and Applications in Neural Networks

Author: Vugar E. Ismailov

language: en

Publisher: American Mathematical Society

Release Date: 2021-12-17


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Recent years have witnessed a growth of interest in the special functions called ridge functions. These functions appear in various fields and under various guises. They appear in partial differential equations (where they are called plane waves), in computerized tomography, and in statistics. Ridge functions are also the underpinnings of many central models in neural network theory. In this book various approximation theoretic properties of ridge functions are described. This book also describes properties of generalized ridge functions, and their relation to linear superpositions and Kolmogorov's famous superposition theorem. In the final part of the book, a single and two hidden layer neural networks are discussed. The results obtained in this part are based on properties of ordinary and generalized ridge functions. Novel aspects of the universal approximation property of feedforward neural networks are revealed. This book will be of interest to advanced graduate students and researchers working in functional analysis, approximation theory, and the theory of real functions, and will be of particular interest to those wishing to learn more about neural network theory and applications and other areas where ridge functions are used.

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits


Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Author: Amith Singhee

language: en

Publisher: Springer Science & Business Media

Release Date: 2009-08-14


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As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.