Novel Algorithms For Fast Statistical Analysis Of Scaled Circuits
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author: Amith Singhee
language: en
Publisher: Springer Science & Business Media
Release Date: 2009-08-14
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
Automated Design of Analog and High-frequency Circuits
Computational intelligence techniques are becoming more and more important for automated problem solving nowadays. Due to the growing complexity of industrial applications and the increasingly tight time-to-market requirements, the time available for thorough problem analysis and development of tailored solution methods is decreasing. There is no doubt that this trend will continue in the foreseeable future. Hence, it is not surprising that robust and general automated problem solving methods with satisfactory performance are needed.
Embedded Memories for Nano-Scale VLSIs
Author: Kevin Zhang
language: en
Publisher: Springer Science & Business Media
Release Date: 2009-04-21
Kevin Zhang Advancement of semiconductor technology has driven the rapid growth of very large scale integrated (VLSI) systems for increasingly broad applications, incl- ing high-end and mobile computing, consumer electronics such as 3D gaming, multi-function or smart phone, and various set-top players and ubiquitous sensor and medical devices. To meet the increasing demand for higher performance and lower power consumption in many different system applications, it is often required to have a large amount of on-die or embedded memory to support the need of data bandwidth in a system. The varieties of embedded memory in a given system have alsobecome increasingly more complex, ranging fromstatictodynamic and volatile to nonvolatile. Among embedded memories, six-transistor (6T)-based static random access memory (SRAM) continues to play a pivotal role in nearly all VLSI systems due to its superior speed and full compatibility with logic process technology. But as the technology scaling continues, SRAM design is facing severe challenge in mainta- ing suf?cient cell stability margin under relentless area scaling. Meanwhile, rapid expansion in mobile application, including new emerging application in sensor and medical devices, requires far more aggressive voltage scaling to meet very str- gent power constraint. Many innovative circuit topologies and techniques have been extensively explored in recent years to address these challenges.