Multivariate Data Analysis For Root Cause Analyses And Time Of Flight Secondary Ion Mass Spectrometry
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Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
Author: Danica Heller-Krippendorf
language: en
Publisher: Springer Nature
Release Date: 2019-10-31
Danica Heller-Krippendorf develops concepts and approaches optimizing the applicability of MVA on data sets from an industrial context. They enable more time-efficient MVA of the respective ToF‐SIMS data. Priority is given to two main aspects by the author: First, the focus is on strategies for a more time-efficient collection of the input data. This includes the optimal selection of the number of replicate measurements, the selection of input data and guidelines for the selection appropriate data preprocessing methods. Second, strategies for more efficient analysis of MVA results are presented. About the Author: Danica Heller-Krippendorf did her research and dissertation at the University of Siegen, Germany, in collaboration with a German analytical service company. Now she is engineer in analytics at a DAX company.
Secondary Ion Mass Spectrometry
Author: Paweł Piotr Michałowski
language: en
Publisher: Royal Society of Chemistry
Release Date: 2025-06-06
Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in semiconductor manufacture, in forensics for enhancement of fingerprints and to determine the composition of cometary dust. This book briefly introduces the fundamentals of the SIMS technique and discusses in detail recent advancements and applications in various branches of science. From an extensive literature review, it provides a good overview of how to reproduce the most prominent experiments and what instruments are required or suited to the analysis. It will inspire new designs and hence research for the future. Appealing to graduates or postgraduates who want an overview of the field and how to use this technique, researchers new to this field will find innovative solutions and how to achieve them detailed herein.
Compendium of Surface and Interface Analysis
Author: The Surface Science Society of Japan
language: en
Publisher: Springer
Release Date: 2018-02-19
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.