Information Modeling For Interoperable Dimensional Metrology


Download Information Modeling For Interoperable Dimensional Metrology PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Information Modeling For Interoperable Dimensional Metrology book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages.

Download

Information Modeling for Interoperable Dimensional Metrology


Information Modeling for Interoperable Dimensional Metrology

Author: Y Zhao

language: en

Publisher: Springer Science & Business Media

Release Date: 2011-08-28


DOWNLOAD





Dimensional metrology is an essential part of modern manufacturing technologies, but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity. Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.

Proceedings of the 37th International MATADOR Conference


Proceedings of the 37th International MATADOR Conference

Author: Srichand Hinduja

language: en

Publisher: Springer Science & Business Media

Release Date: 2012-10-09


DOWNLOAD





Presented here are 97 refereed papers given at the 37th MATADOR Conference held at The University of Manchester in July 2012. The MATADOR series of conferences covers the topics of Manufacturing Automation and Systems Technology, Applications, Design, Organisation and Management, and Research. The Proceedings of this Conference contain original papers contributed by researchers from many countries on different continents. The papers cover the principles, techniques and applications in aerospace, automotive, biomedical, energy, consumable goods and process industries. The papers in this volume reflect: the importance of manufacturing to international wealth creation; the emerging fields of micro- and nano-manufacture; the increasing trend towards the fabrication of parts using lasers; the growing demand for precision engineering and part inspection techniques, and the changing trends in manufacturing within a global environment.

An Intelligent Inspection Planning System for Prismatic Parts on CMMs


An Intelligent Inspection Planning System for Prismatic Parts on CMMs

Author: Slavenko M. Stojadinović

language: en

Publisher: Springer

Release Date: 2019-02-09


DOWNLOAD





This book examines an intelligent system for the inspection planning of prismatic parts on coordinate measuring machines (CMMs). The content focuses on four main elements: the engineering ontology, the model of inspection planning for prismatic parts on CMMs, the optimisation model of the measuring path based on an ant-colony approach, and the model of probe configuration and setup planning based on a genetic algorithm. The model of inspection planning for CMMs developed here addresses inspection feature construction, the sampling strategy, probe accessibility analysis, automated collision-free operation, and probe path planning. The proposed model offers a novel approach to intelligent inspection, while also minimizing human involvement (and thus the risk of human error) through intelligent planning of the probe configuration and part setup. The advantages of this approach include: reduced preparation times due to the automatic generation of a measuring protocol; potential optimisation of the measuring probe path, i.e., less time needed for the actual measurement; and increased planning process autonomy through minimal human involvement in the setup analysis and probe configuration.