Examining Optoelectronics In Machine Vision And Applications In Industry 4 0


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Examining Optoelectronics in Machine Vision and Applications in Industry 4.0


Examining Optoelectronics in Machine Vision and Applications in Industry 4.0

Author: Sergiyenko, Oleg

language: en

Publisher: IGI Global

Release Date: 2021-02-12


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The research and exploitation of optoelectronic properties in the industrial branch of electronics is becoming more popular each day due to the important role they play in the development of a large variety of sensors, devices, and systems for identifying, measuring, and constructing. While optoelectronics study the applications of electronic devices that source, detect, and transform light, machine vision generates and detects light in order to provide imaging-based automatic inspections and analysis for such applications as automatic object and environmental inspection, process control, and robot/mobile machine guidance in industry. Machine vision is less efficient without optoelectronics, and thus, it is important to investigate the theoretical approaches to different optoelectronic devices available for machine vision as well as current scanning technologies. Examining Optoelectronics in Machine Vision and Applications in Industry 4.0 focuses on the examination of emerging technologies for the design, fabrication, and implementation of optoelectronic sensors, devices, and systems in a machine vision approach to support industrial, commercial, and scientific applications. The book covers topics such as the design, fabrication, and implementation of sensors and devices as well as the development viewpoint of optoelectronic systems and artificial vision techniques using optoelectronic devices. The interaction and informational communication between all these mentioned devices in the complex solution of the same task is the subject of modern challenges in Industry 4.0. Thus, this book supports engineers, technology developers, academicians, researchers, and students who seek machine vision techniques for detection, measurement, and 3D reconstruction.

Proceedings of the 23rd International Conference on Industrial Engineering and Engineering Management 2016


Proceedings of the 23rd International Conference on Industrial Engineering and Engineering Management 2016

Author: Ershi Qi

language: en

Publisher: Springer

Release Date: 2017-03-07


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International Conference on Industrial Engineering and Engineering Management is sponsored by Chinese Industrial Engineering Institution, CMES, which is the unique national-level academic society of Industrial Engineering. The conference is held annually as the major event in this area. Being the largest and the most authoritative international academic conference held in China, it supplies an academic platform for the experts and the entrepreneurs in International Industrial Engineering and Management area to exchange their research results. Many experts in various fields from China and foreign countries gather together in the conference to review, exchange, summarize and promote their achievements in Industrial Engineering and Engineering Management fields. Some experts pay special attention to the current situation of the related techniques application in China as well as their future prospect, such as Industry 4.0, Green Product Design, Quality Control and Management, Supply Chain and logistics Management to cater for the purpose of low-carbon, energy-saving and emission-reduction and so on. They also come up with their assumption and outlook about the related techniques' development. The proceedings will offer theatrical methods and technique application cases for experts from college and university, research institution and enterprises who are engaged in theoretical research of Industrial Engineering and Engineering Management and its technique's application in China. As all the papers are feathered by higher level of academic and application value, they also provide research data for foreign scholars who occupy themselves in investigating the enterprises and engineering management of Chinese style.

International Aerospace Abstracts


International Aerospace Abstracts

Author:

language: en

Publisher:

Release Date: 1998


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