Charged Particle Optics Theory
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Charged Particle Optics Theory
Charged Particle Optics Theory: An Introduction identifies the most important concepts of charged particle optics theory, and derives each mathematically from the first principles of physics. Assuming an advanced undergraduate-level understanding of calculus, this book follows a logical progression, with each concept building upon the preceding one. Beginning with a non-mathematical survey of the optical nature of a charged particle beam, the text: Discusses both geometrical and wave optics, as well as the correspondence between them Describes the two-body scattering problem, which is essential to the interaction of a fast charged particle with matter Introduces electron emission as a practical consequence of quantum mechanics Addresses the Fourier transform and the linear second-order differential equation Includes problems to amplify and fill in the theoretical details, with solutions presented separately Charged Particle Optics Theory: An Introduction makes an ideal textbook as well as a convenient reference on the theoretical origins of the optics of charged particle beams. It is intended to prepare the reader to understand the large body of published research in this mature field, with the end result translated immediately to practical application.
Applied Charged Particle Optics
Author: Helmut Liebl
language: en
Publisher: Springer Science & Business Media
Release Date: 2008-01-12
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Handbook of Charged Particle Optics
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.