Characterization And Modeling Of Proton Radiation Effects In Linear Bipolar Devices And Circuits
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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Author: Ronald D Schrimpf
language: en
Publisher: World Scientific
Release Date: 2004-07-29
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.