Vlsi

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VLSI Test Principles and Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
VLSI Design

Very Large Scale Integration (VLSI) has become a necessity rather than a specialization for electrical and computer engineers. This unique text provides Engineering and Computer Science students with a comprehensive study of the subject, covering VLSI from basic design techniques to working principles of physical design automation tools to leading edge application-specific array processors. Beginning with CMOS design, the author describes VLSI design from the viewpoint of a digital circuit engineer. He develops physical pictures for CMOS circuits and demonstrates the top-down design methodology using two design projects - a microprocessor and a field programmable gate array. The author then discusses VLSI testing and dedicates an entire chapter to the working principles, strengths, and weaknesses of ubiquitous physical design tools. Finally, he unveils the frontiers of VLSI. He emphasizes its use as a tool to develop innovative algorithms and architecture to solve previously intractable problems. VLSI Design answers not only the question of "what is VLSI," but also shows how to use VLSI. It provides graduate and upper level undergraduate students with a complete and congregated view of VLSI engineering.