Vlsi Design For Manufacturing Yield Enhancement
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VLSI Design for Manufacturing: Yield Enhancement
Author: Stephen W. Director
language: en
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Design for Manufacturability and Statistical Design
Author: Michael Orshansky
language: en
Publisher: Springer Science & Business Media
Release Date: 2007-10-28
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
High-Level VLSI Synthesis
Author: Raul Camposano
language: en
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
The time has come for high-level synthesis. When research into synthesizing hardware from abstract, program-like de scriptions started in the early 1970' s, there was no automated path from the register transfer design produced by high-level synthesis to a complete hardware imple mentation. As a result, it was very difficult to measure the effectiveness of high level synthesis methods; it was also hard to justify to users the need to automate architecture design when low-level design had to be completed manually. Today's more mature CAD techniques help close the gap between an automat ically synthesized design and a manufacturable design. Market pressures encour age designers to make use of any and all automated tools. Layout synthesis, logic synthesis, and specialized datapath generators make it feasible to quickly imple ment a register-transfer design in silicon,leaving designers more time to consider architectural improvements. As IC design becomes more automated, customers are increasing their demands; today's leading edge designers using logic synthesis systems are training themselves to be tomorrow's consumers of high-level synthe sis systems. The need for very fast turnaround, a competitive fabrication market WhlCh makes small-quantity ASIC manufacturing possible, and the ever growing co:n plexity of the systems being designed, all make higher-level design automaton inevitable.