Ultrafast Processes In Spectroscopy 1991

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Laser Spectroscopy

Author: Wolfgang Demtröder
language: en
Publisher: Springer Science & Business Media
Release Date: 2008-07-23
Keeping abreast of the latest techniques and applications, this new edition of the standard reference and graduate text on laser spectroscopy has been completely revised and expanded. While the general concept is unchanged, the new edition features a broad array of new material. This new edition has been completely revised, especially the chapters on non linear spectroscopy, ion trapping, ultra short laser pulses and new developments. Fifty new figures illustrate the newest developments and results. The author is one of the most renowned experts in this area and no other book with this broad scope is available.
Optical Phenomena in Semiconductor Structures of Reduced Dimensions

Author: D.J. Lockwood
language: en
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
Remarkable advances in semiconductor growth and processing technologies continue to have a profound impact on condensed-matter physics and to stimulate the invention of novel optoelectronic effects. Intensive research on the behaviors of free carriers has been carried out in the two-dimensional systems of semiconductor heterostructures and in the one and zero-dimensional systems of nanostructures created by the state-of-the-art fabrication methods. These studies have uncovered unexpected quantum mechanical correlations that arise because of the combined effects of strong electron-electron interactions and wave function confinement associated with reduced dimensionality. The investigations of these phenomena are currently at the frontiers of condensed-matter physics. They include areas like the fractional quantum Hall effect, the dynamics of electrons on an ultra short (femtosecond) time scale, electron behavior in quantum wires and dots, and studies of electron tunneling phenomena in ultra small semiconductor structures. Optical techniques have made important contributions to these fields in recent years, but there has been no coherent review of this work until now. The book provides an overview of these recent developments that will be of interest to semiconductor materials scientists in university, government and industrial laboratories.