Types Of Vlsi Design


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Types for Proofs and Programs


Types for Proofs and Programs

Author: Stefano Berardi

language: en

Publisher: Springer Science & Business Media

Release Date: 1996-10-02


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This volume contains a refereed selection of revised full papers chosen from the contributions presented during the Third Annual Workshop held under the auspices of the ESPRIT Basic Research Action 6453 Types for Proofs and Programs. The workshop took place in Torino, Italy, in June 1995. Type theory is a formalism in which theorems and proofs, specifications and programs can be represented in a uniform way. The 19 papers included in the book deal with foundations of type theory, logical frameworks, and implementations and applications; all in all they constitute a state-of-the-art survey for the area of type theory.

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design


Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design

Author: Xiaowei Li

language: en

Publisher: Springer Nature

Release Date: 2023-03-01


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With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.

Digital VLSI Systems


Digital VLSI Systems

Author: Mohamed I. Elmasry

language: en

Publisher: Institute of Electrical & Electronics Engineers(IEEE)

Release Date: 1985


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