Thermal And Power Management Of Integrated Circuits
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Thermal and Power Management of Integrated Circuits
Author: Arman Vassighi
language: en
Publisher: Springer Science & Business Media
Release Date: 2006-06-01
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Thermal and Power Management of Integrated Circuits
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Power Management Integrated Circuits
This book intends to be a comprehensive text on the topic of integrated circuits for power management, putting together both theoretical foundations and practical details, leading to successful design practices in research and industry. It covers all the three main categories of power management circuits, viz., linear regulators, inductor-based switchers and switched-capacitor circuits, and presents detailed discussion of their common topologies, operation and modeling. Features Includes underlying theory and design/implementation practical ingredients for power management integrated circuits (PMICs). Provides in-depth analysis of topologies and circuits related to linear regulators, switched-capacitor converters and inductor-based converters. Covers all the relevant topics at the intersection between power electronics and integrated circuit design areas. Provides guidelines for design of circuits and solutions for all the pertinent topologies. Indicates all important issues and the related trade-offs in the design of PMICs. The book will be a valuable resource for senior- and graduate-level students as well as industry professionals who have done university-level courses on analog circuit design, control systems and power electronics.