The Vna Applications Handbook
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The VNA Applications Handbook
Written by prominent experts in the field, this authoritative new resource provides guidelines for performing a wide variety of Vector Network Analyzers (VNA) measurements. The capabilities and limitations of modern VNA in the context of challenging real-world applications are explained, as well as insights for optimizing test setups and instrument settings, making accurate measurements and, equally important, avoiding costly mistakes. Organized by topic, the readers can focus on chapters covering particular measurement challenges. Application topics include linear and non-linear measurements of passive and active devices, frequency converting devices, and special considerations for high-power, high-gain, and pulsed devices. Signal Integrity and time-domain reflectometry are covered, as well as emerging applications at millimeter-wave frequencies driven by 5G and automotive radar. Waveguide is presented, with emphasis on understanding guided-wave propagation and the associated calculations required for creating calibration standards. Each application is supported by illustrations that help explain key concepts and VNA screenshots are used to show both expected and, in some cases, unexpected results. This book equips engineers and lab technicians to better understand these important instruments, and effectively use them to develop the technologies that drive our world.
Handbook of Microwave Component Measurements
Author: Joel P. Dunsmore
language: en
Publisher: John Wiley & Sons
Release Date: 2020-06-29
Handbook of Microwave Component Measurements Second Edition is a fully updated, complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author writes with a simplicity that is easily accessible to the student or new engineer, yet is thorough enough to provide details of measurement science for even the most advanced applications and researchers. This welcome new edition brings forward the most modern techniques used in industry today, and recognizes that more new techniques have developed since the first edition published in 2012. Whilst still focusing on the VNA, these techniques are also compatible with other vendor's advanced equipment, providing a comprehensive industry reference.
On-Wafer Microwave Measurements and De-embedding
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.