Test And Measurement Know It All
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Test and Measurement: Know It All
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing. - A 360-degree view from our best-selling authors - Topics include the Technology of Test and Measurement, Measurement System Types, and Instrumentation for Test and Measurement - The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume
Circuit Design: Know It All
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf! Electronics Engineers need to master a wide area of topics to excel. The Circuit Design Know It All covers every angle including semiconductors, IC Design and Fabrication, Computer-Aided Design, as well as Programmable Logic Design. . A 360-degree view from our best-selling authors . Topics include fundamentals, Analog, Linear, and Digital circuits . The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume
Digital Information Processing and Communications, Part II
This two-volume-set (CCIS 188 and CCIS 189) constitutes the refereed proceedings of the International Conference on Digital Information Processing and Communications, ICDIPC 2011, held in Ostrava, Czech Republic, in July 2011. The 91 revised full papers of both volumes presented together with 4 invited talks were carefully reviewed and selected from 235 submissions. The papers are organized in topical sections on network security; Web applications; data mining; neural networks; distributed and parallel processing; biometrics technologies; e-learning; information ethics; image processing; information and data management; software engineering; data compression; networks; computer security; hardware and systems; multimedia; ad hoc network; artificial intelligence; signal processing; cloud computing; forensics; security; software and systems; mobile networking; and some miscellaneous topics in digital information and communications.