Synthesis Techniques For Pseudo Random Built In Self Test
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A Designer’s Guide to Built-In Self-Test
Author: Charles E. Stroud
language: en
Publisher: Springer Science & Business Media
Release Date: 2005-12-27
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Recent Findings in Boolean Techniques
This book describes recent findings in the domain of Boolean logic and Boolean algebra, covering application domains in circuit and system design, but also basic research in mathematics and theoretical computer science. Content includes invited chapters and a selection of the best papers presented at the 14th annual International Workshop on Boolean Problems.
Optimal VLSI Architectural Synthesis
Author: Catherine H. Gebotys
language: en
Publisher: Springer Science & Business Media
Release Date: 2012-12-06
Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions.