Scanning Probe Techniques For Materials Characterization At Nanometer Scale
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Scanning Probe Techniques for Materials Characterization at Nanometer Scale
Author: Douglas C. Hansen
language: en
Publisher: The Electrochemical Society
Release Date: 2001
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Author: Paula Maria Vilarinho
language: en
Publisher: Springer Science & Business Media
Release Date:
Handbook of Materials Characterization
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.