Recent Developments In Atomic Force Microscopy And Raman Spectroscopy For Materials Characterization
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Author: Chandra Shakher Pathak
language: en
Publisher: BoD – Books on Demand
Release Date: 2022-01-07
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Smart Sensors
The reference text comprehensively discusses micro-electromechanical systems and nanoelectromechanical systems-based design of smart sensors, fabrication techniques for smart sensors, and smart wearable stress monitoring devices for autistic children. It covers applications of smart sensors in diverse areas including medical, agricultural, space, automobiles, manufacturing, security, and surveillance. This book: Discuss design parameters of micro-electromechanical systems and nanoelectromechanical systems-based smart sensors. Covers smart sensors for conditioning and monitoring of electrical machines, robotic systems, and electric vehicles. Highlights the importance of using smart sensors in localization, navigation, and mapping. Explains efficient mobile Ad-hoc network using predictive link sustainability model, and smart sensor technologies for the Internet of Things applications. Illustrates the graded node deployment with improved M-LEACH protocol to increase the lifetime of wireless sensor networks. It is primarily written for senior undergraduates, graduate students, and academic researchers in the fields of electrical engineering, electronics and communications engineering, sensor technology, nanoscience, and nanotechnology.
Concise Encyclopedia of Materials Characterization
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general.The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.