Recent Advances In Metrology Characterization And Standards For Optical Digital Data Disks
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Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
Author: Fernando L. Podio
language: en
Publisher: SPIE-International Society for Optical Engineering
Release Date: 1999
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)
language: en
Publisher:
Release Date: 2000