Random Graphs For Statistical Pattern Recognition
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Random Graphs for Statistical Pattern Recognition
Author: David J. Marchette
language: en
Publisher: John Wiley & Sons
Release Date: 2005-02-11
A timely convergence of two widely used disciplines Random Graphs for Statistical Pattern Recognition is the first book to address the topic of random graphs as it applies to statistical pattern recognition. Both topics are of vital interest to researchers in various mathematical and statistical fields and have never before been treated together in one book. The use of data random graphs in pattern recognition in clustering and classification is discussed, and the applications for both disciplines are enhanced with new tools for the statistical pattern recognition community. New and interesting applications for random graph users are also introduced. This important addition to statistical literature features: Information that previously has been available only through scattered journal articles Practical tools and techniques for a wide range of real-world applications New perspectives on the relationship between pattern recognition and computational geometry Numerous experimental problems to encourage practical applications With its comprehensive coverage of two timely fields, enhanced with many references and real-world examples, Random Graphs for Statistical Pattern Recognition is a valuable resource for industry professionals and students alike.
Statistical Pattern Recognition
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: Provides a self-contained introduction to statistical pattern recognition. Includes new material presenting the analysis of complex networks. Introduces readers to methods for Bayesian density estimation. Presents descriptions of new applications in biometrics, security, finance and condition monitoring. Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications Describes mathematically the range of statistical pattern recognition techniques. Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields. www.wiley.com/go/statistical_pattern_recognition
Structural, Syntactic, and Statistical Pattern Recognition
This volume constitutes the refereed proceedings of the Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition (SSPR 2012) and Statistical Techniques in Pattern Recognition (SPR 2012), held in Hiroshima, Japan, in November 2012 as a satellite event of the 21st International Conference on Pattern Recognition, ICPR 2012. The 80 revised full papers presented together with 1 invited paper and the Pierre Devijver award lecture were carefully reviewed and selected from more than 120 initial submissions. The papers are organized in topical sections on structural, syntactical, and statistical pattern recognition, graph and tree methods, randomized methods and image analysis, kernel methods in structural and syntactical pattern recognition, applications of structural and syntactical pattern recognition, clustering, learning, kernel methods in statistical pattern recognition, kernel methods in statistical pattern recognition, as well as applications of structural, syntactical, and statistical methods.