Proceedings Of The 7th International Workshop On Beam Injection Assessment Of Microstructures In Semiconductors


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Beam Injection Assessment of Microstructures in Semiconductors


Beam Injection Assessment of Microstructures in Semiconductors

Author: Hajime Tomokage

language: en

Publisher:

Release Date: 2001


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The characterisation of semiconductors is of key importance in preparing and applying semiconductors in industry. The present work deals with theoretical and experimental topics which are related to the assessment of microstructures in semiconductors by means of beam injection and related methods.