Next Generation Design For Testability Debug And Reliability Using Formal Techniques

Design for Testability, Debug and Reliability

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Next Generation Design for Testability, Debug and Reliability Using Formal Techniques

Product Design and Testing for Automotive Engineering: Volume II

Failure modes and effects analysis (FMEA); Reliability; Product Development; Design Process; Test Procedures "Explore Product Design and Testing for Automotive Engineering: Volume II, an essential guide reshaping vehicle manufacturing with unprecedented reliability. As part of SAE International’s DOE for Product Reliability Growth series, this practical resource introduces cutting-edge methodologies crucial for predicting and improving product reliability in an era of automotive electrification. The book navigates statistical tolerance design, showcasing how variability in part fabrication and assembly can enhance reliability and sustainability. Key topics include: - Statistical tolerance design's impact on manufacturing and material selection, focusing on non-normal distributions' effects on product assembly and cost. Methods like maximum likelihood estimators and Monte Carlo simulations are used for assembly strategy synthesis. - Reliability DOEs using log-location-scale distributions to estimate lifetimes of non-normally distributed components, especially in accelerated life testing. It covers transformations optimizing parts and system designs under the lognormal distribution. - Weibull distribution (DOE-W) for characterizing lifetimes affected by various failure modes, detailing parameter assessment methods and real-world applications. The book also introduces reliability design of experiments based on the exponential distribution (DOE-E). - Importance of predicting lifecycles and enhancing reliability through qualitative and stepwise accelerated life tests. Integration of physics of failure with statistical methods like Weibull statistics and lognormal approximation enhances analysis credibility. - Inferential mechanisms such as the Arrhenius and Eyring models in predicting automotive component lifecycles, refining product life prediction based on reliability DOEs. Whether you're an engineer, researcher, or automotive professional, this book equips you to navigate reliability engineering confidently. Revolutionize your approach to product design and testing with Product Design and Testing for Automotive Engineering, your definitive companion in shaping the future of automotive reliability." (ISBN 9781468607703 ISBN 9781468607697 ISBN 9781468607727 DOI 10.4271/9781468607697)