Models Methods And Tools For Complex Chip Design
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Models, Methods, and Tools for Complex Chip Design
Author: Jan Haase
language: en
Publisher: Springer Science & Business Media
Release Date: 2013-09-18
This book brings together a selection of the best papers from the fifteenth edition of the Forum on specification and Design Languages Conference (FDL), which was held in September 2012 at Vienna University of Technology, Vienna, Austria. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems.
Fundamentals of Design of Experiments for Automotive Engineering Volume I
In a world where innovation and sustainability are paramount, Fundamentals of Design of Experiments for Automotive Engineering: Volume I serves as a definitive guide to harnessing the power of statistical thinking in product development. As first of four volumes in SAE International’s DOE for Product Reliability Growth series, this book presents a practical, application-focused approach by emphasizing DOE as a dynamic tool for automotive engineers. It showcases real-world examples, demonstrating how process improvements and system optimizations can significantly enhance product reliability. The author, Yung Chiang, leverages extensive product development expertise to present a comprehensive process that ensures product performance and reliability throughout its entire lifecycle. Whether individuals are involved in research, design, testing, manufacturing, or marketing, this essential reference equips them with the skills needed to excel in their respective roles. This book explores the potential of Reliability and Sustainability with DOE, featuring the following topics: - Fundamental prerequisites for deploying DOE: Product reliability processes, measurement uncertainty, failure analysis, and design for reliability. - Full factorial design 2K: A system identification tool for relating objectives to factors and understanding main and interactive effects. - Fractional factorial design 2RK-P: Ideal for identifying main effects and 2-factor interactions. - General fractional factorial design LK-P: Systematically identification of significant inputs and analysis of nonlinear behaviors. - Composite designs as response surface methods: Resolving interactions and optimizing decisions with limited factors. - Adapting to practical challenges with “short” DOE: Leveraging optimization schemes like D-optimality, and A-optimality for optimal results. Readers are encouraged not to allow product failures to hinder progress but to embrace the "statistical thinking" embedded in DOE. This book can illuminate the path to designing products that stand the test of time, resulting in satisfied customers and thriving businesses. (ISBN 9781468606027, ISBN 9781468606034, ISBN 9781468606041, DOI 10.4271/9781468606034)
Low Power Methodology Manual
Author: David Flynn
language: en
Publisher: Springer Science & Business Media
Release Date: 2007-07-31
“Tools alone aren't enough to reduce dynamic and leakage power in complex chip designs - a well-planned methodology is needed. Following in the footsteps of the successful Reuse Methodology Manual (RMM), authors from ARM and Synopsys have written this Low Power Methodology Manual (LPMM) to describe [such] [a] low-power methodology with a practical, step-by-step approach.” Richard Goering, Software Editor, EE Times “Excellent compendium of low-power techniques and guidelines with balanced content spanning theory and practical implementation. The LPMM is a very welcome addition to the field of low power SoC implementation that has for many years operated in a largely ad-hoc fashion.” Sujeeth Joseph, Chief Architect - Semiconductor and Systems Solutions Unit, Wipro Technologies “The LPMM enables broader adoption of aggressive power management techniques based on extensive experience and silicon example with real data that every SOC designer can use to meet the difficulties faced in managing the power issues in deep submicron designs.” Anil Mankar, Sr VP Worldwide Core Engineering and Chief Development Officer, Conexant Systems Inc. “Managing power, at 90nm and below, introduces significant challenges to design flow. The LPMM is a timely and immediately useful book that shows how combination of tools, IP and methodology can be used together to address power management.” Nick Salter, Head of Chip Integration, CSR plc.