Microelectronics Fialure Analysis Desk Reference Seventh Edition


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Microelectronics Failure Analysis


Microelectronics Failure Analysis

Author: Tejinder Gandhi

language: en

Publisher:

Release Date: 2019


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Microelectronics Fialure Analysis Desk Reference, Seventh Edition


Microelectronics Fialure Analysis Desk Reference, Seventh Edition

Author: Tejinder Gandhi

language: en

Publisher: ASM International

Release Date: 2019-11-01


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The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.

Reliability of Organic Compounds in Microelectronics and Optoelectronics


Reliability of Organic Compounds in Microelectronics and Optoelectronics

Author: Willem Dirk van Driel

language: en

Publisher: Springer Nature

Release Date: 2022-01-31


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This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.


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