Microelectronic Failure Analysis Desk Reference


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Microelectronics Failure Analysis


Microelectronics Failure Analysis

Author:

language: en

Publisher: ASM International

Release Date: 2004-01-01


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For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Microelectronic Failure Analysis Desk Reference


Microelectronic Failure Analysis Desk Reference

Author:

language: en

Publisher: ASM International

Release Date: 2001-01-01


DOWNLOAD





Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Microelectronic Failure Analysis


Microelectronic Failure Analysis

Author: Thomas W. Lee

language: en

Publisher: Asm International

Release Date: 1993


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A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical characterization, specimen preparation, metallurgical