Mems Reliability

MEMS Reliability

The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.

Novel Algorithms and Techniques in Telecommunications, Automation and Industrial Electronics

Novel Algorithms and Techniques in Telecommunications, Automation and Industrial Electronics includes a set of rigorously reviewed world-class manuscripts addressing and detailing state-of-the-art research projects in the areas of Industrial Electronics, Technology and Automation, Telecommunications and Networking. Novel Algorithms and Techniques in Telecommunications, Automation and Industrial Electronics includes selected papers form the conference proceedings of the International Conference on Industrial Electronics, Technology and Automation (IETA 2007) and International Conference on Telecommunications and Networking (TeNe 07) which were part of the International Joint Conferences on Computer, Information and Systems Sciences and Engineering (CISSE 2007).

MEMS Reliability for Critical Applications