Measurement Of X Ray Cross Sections Relevant To A Scanning Ion Microscope
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Measurement of X-ray Cross Sections Relevant to a Scanning Ion Microscope
The following is discussed in this report: Design and construction of a novel soft X-ray spectrometer; Integration of the spectrometer into a concurrently designed and constructed vacuum system and electronic system; Measurement of the 280 eV K X-ray emission cross section for carbon foil bombarded with 1-3 MeV carbon, nitrogen and oxygen ions; Discovery and analysis of satellite lines and solid state effects in the 270-290 eV region of spectra measured during prosecution of the above item.