Materials Characterization
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Materials Characterization
Part One - Microstructure Examinations Light microscopy X-ray diffraction Transmission electron microscopy Scanning electron microscopy Scanning probe microscopy Part Two--Chemical and Thermal Analysis X-Ray Spectroscopy for Elemental Analysis Electron Spectroscopy for Surface Analysis Secondary Ion Mass Spectrometry for Surface Analysis Vibrational Spectroscopy for Molecular Analysis Thermal analysis.
Encyclopedia of Materials Characterization
Author: Charles A. Evans
language: en
Publisher: Gulf Professional Publishing
Release Date: 1992
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
In-situ Materials Characterization
Author: Alexander Ziegler
language: en
Publisher: Springer Science & Business Media
Release Date: 2014-04-01
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.