Materials And Processes For Nonvolatile Memories

Materials and Processes for Nonvolatile Memories

Materials and Processes for Nonvolatile Memories: Volume 997

This book, first published in 2007 and the second in a series from MRS, focuses on the scientific and technological exploration of materials and devices with nonvolatile memory properties. Strong and increasing interest in nonvolatile memories, both domestic and international, indicates the worldwide importance of these materials and memory devices. The papers in this volume represent the latest technical advancements and information on nonvolatile memory devices from universities, national laboratories and industry. They also provide insight into emerging trends. Research results are presented for: polymer and molecular nonvolatile memory devices; flash nonvolatile memory devices; nanoparticle nonvolatile memory devices; resistance switching nonvolatile memory devices; ferroelectric nonvolatile memory devices; phase-change nonvolatile memory devices; and magnetic nonvolatile memory devices and others.

Materials and Process Characterization

VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.