Lifetime Reliability Aware Design Of Integrated Circuits
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Lifetime Reliability-aware Design of Integrated Circuits
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Approximate Computing
This book explores the technological developments at various levels of abstraction, of the new paradigm of approximate computing. The authors describe in a single-source the state-of-the-art, covering the entire spectrum of research activities in approximate computing, bridging device, circuit, architecture, and system levels. Content includes tutorials, reviews and surveys of current theoretical/experimental results, design methodologies and applications developed in approximate computing for a wide scope of readership and specialists. Serves as a single-source reference to state-of-the-art of approximate computing; Covers broad range of topics, from circuits to applications; Includes contributions by leading researchers, from academia and industry.
Analog IC Reliability in Nanometer CMOS
Author: Elie Maricau
language: en
Publisher: Springer Science & Business Media
Release Date: 2013-01-11
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.