Istfa 2007 Proceedings Of The 33rd International Symposium For Testing And Failure Analysis
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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
language: en
Publisher: ASM International
Release Date: 2007-01-01
Printbegrænsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. session
ISTFA 2009
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.