Introduction To Semiconductor Device Yield Modeling


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Introduction to Semiconductor Device Yield Modeling


Introduction to Semiconductor Device Yield Modeling

Author: Albert V. Ferris-Prabhu

language: en

Publisher: Artech House Materials Science

Release Date: 1992


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This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.

Introduction to Semiconductor Device Modelling


Introduction to Semiconductor Device Modelling

Author: Christopher M. Snowden

language: en

Publisher: World Scientific

Release Date: 1998


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This book deals mainly with physical device models which are developed from the carrier transport physics and device geometry considerations. The text concentrates on silicon and gallium arsenide devices and includes models of silicon bipolar junction transistors, junction field effect transistors (JFETs), MESFETs, silicon and GaAs MESFETs, transferred electron devices, pn junction diodes and Schottky varactor diodes. The modelling techniques of more recent devices such as the heterojunction bipolar transistors (HBT) and the high electron mobility transistors are discussed. This book contains details of models for both equilibrium and non-equilibrium transport conditions. The modelling Technique of Small-scale devices is discussed and techniques applicable to submicron-dimensioned devices are included. A section on modern quantum transport analysis techniques is included. Details of essential numerical schemes are given and a variety of device models are used to illustrate the application of these techniques in various fields.

System-on-Chip


System-on-Chip

Author: Bashir M. Al-Hashimi

language: en

Publisher: IET

Release Date: 2006-01-31


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This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.