Introduction To Atomic Force Microscopy

Introduction to Atomic Force Microscopy

Introduction to Atomic Force Microscopy

This book is addressed at students or researchers who want to deepen their understanding of the peculiar physical aspects of the various measurement modes in AFM that are often not discussed extensively in topical text books. Models for contact and adhesion between bodies are described in detail, so as done for the contact mode, the lateral force mode and the kinetic modes: a large section is dedicated to the physics of the harmonic oscillator interacting with a surface. A brief discussion about the technical aspects is also presented, without going into detail, as these are widely available elsewhere, in textbooks and even on internet sites.

Atomic Force Microscopy

This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.