High Resolution Ab Initio Three Dimensional Coherence X Ray Diffraction Microscopy
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High-Resolution Extreme Ultraviolet Microscopy
This thesis describes novel approaches and implementation of high-resolution microscopy in the extreme ultraviolet light regime. Using coherent ultrafast laser-generated short wavelength radiation for illuminating samples allows imaging beyond the resolution of visible-light microscopes. Michael Zürch gives a comprehensive overview of the fundamentals and techniques involved, starting from the laser-based frequency conversion scheme and its technical implementation as well as general considerations of diffraction-based imaging at nanoscopic spatial resolution. Experiments on digital in-line holography and coherent diffraction imaging of artificial and biologic specimens are demonstrated and discussed in this book. In the field of biologic imaging, a novel award-winning cell classification scheme and its first experimental application for identifying breast cancer cells are introduced. Finally, this book presents a newly developed technique of generating structured illumination by means of so-called optical vortex beams in the extreme ultraviolet regime and proposes its general usability for super-resolution imaging.
High-resolution Ab Initio Three-dimensional X-ray Diffraction Microscopy
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.
High-resolution Ab-initio Three-dimensional Coherence X-ray Diffraction Microscopy
Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.