High Level Test Approaches For Mixed Signal Systems

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Mixed-Signal Circuits

Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.
Testing of Software and Communicating Systems

Author: Kenji Suzuki
language: en
Publisher: Springer Science & Business Media
Release Date: 2008-05-26
This book constitutes the refereed proceedings of the 20th IFIP TC 6/WG 6.1 International Conference on Testing Communicating Systems, TestCom 2008, and the 8th International Workshop on Formal Approaches to Testing of Software, FATES 2008, jointly held in Tokyo, Japan, in June 2008. The 18 revised full papers presented together with 2 invited talks were carefully reviewed and selected from initially 58 submissions to both events. The papers cover new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of communicating systems and general software. They are organized in topical sections on general software testing, testing continuous and real-time systems, network testing, test generation, concurrent system testing, and applications of testing.