Handbook Of Contamination Control In Microelectronics


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Handbook of Contamination Control in Microelectronics


Handbook of Contamination Control in Microelectronics

Author: Donald L. Tolliver

language: en

Publisher: William Andrew

Release Date: 1988


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Covers the basics of contamination control for the beginner, while also focusing in depth on critical issues of process engineering and circuit manufacturing for the more advanced reader. Stresses to readers that what makes the area of contamination control unique is its ubiquitous nature, across all facets of semiconductor manufacturing. Clean room technology, well-recognized as a fundamental requirement in modern day circuit manufacturing, barely scratches the surface in total contamination control.

Handbook of Contamination Control in Microelectronics


Handbook of Contamination Control in Microelectronics

Author: Donald L. Tolliver

language: en

Publisher: William Andrew

Release Date: 1988-12-31


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Covers the basics of contamination control for the beginner, while also focusing in depth on critical issues of process engineering and circuit manufacturing for the more advanced reader. Stresses to readers that what makes the area of contamination control unique is its ubiquitous nature, across all facets of semiconductor manufacturing. Clean room technology, well-recognized as a fundamental requirement in modern day circuit manufacturing, barely scratches the surface in total contamination control.

Fundamentals of Contamination Control


Fundamentals of Contamination Control

Author: Alan C. Tribble

language: en

Publisher: SPIE Press

Release Date: 2000


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This Tutorial Text provides a comprehensive introduction to the subject of contamination control, with specific applications to the aerospace industry. The author draws upon his many years as a practicing contamination control engineer, researcher, and teacher. The book examines methods to quantify the cleanliness level required by various contamination-sensitive surfaces and to predict the end-of-life contamination level for those surfaces, and it identifies contamination control techniques required to ensure mission success.