Fast Algorithms For Structured Least Squares And Total Least Squares Problems

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Total Least Squares and Errors-in-Variables Modeling

Author: S. van Huffel
language: en
Publisher: Springer Science & Business Media
Release Date: 2013-03-14
In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.
Efficient Online Learning Algorithms for Total Least Square Problems

This book reports the developments of the Total Least Square (TLS) algorithms for parameter estimation and adaptive filtering. Specifically, it introduces the authors’ latest achievements in the past 20 years, including the recursive TLS algorithms, the approximate inverse power iteration TLS algorithm, the neural based MCA algorithm, the neural based SVD algorithm, the neural based TLS algorithm, the TLS algorithms under non-Gaussian noises, performance analysis methods of TLS algorithms, etc. In order to faster the understanding and mastering of the new methods provided in this book for readers, before presenting each new method in each chapter, a specialized section is provided to review the closely related several basis models. Throughout the book, large of procedure of new methods are provided, and all new algorithms or methods proposed by us are tested and verified by numerical simulations or actual engineering applications. Readers will find illustrative demonstration examples on a range of industrial processes to study. Readers will find out the present deficiency and recent developments of the TLS parameter estimation fields, and learn from the the authors’ latest achievements or new methods around the practical industrial needs. In my opinion, this book can be assimilated by advanced undergraduates and graduate students, as well as statisticians, because of the new tools in data analysis, applied mathematics experts, because of the novel theories and techniques that we propose, engineers, above all for the applications in control, system identification, computer vision, and signal processing.