Electron Microscopes Spectroscopy And Their Applications
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Electron Microscopes, Spectroscopy and Their Applications
Author: Guillermo Huerta Cuellar
language: en
Publisher: BoD – Books on Demand
Release Date: 2024-05-22
This book explores the use of electronic microscopes and spectroscopic techniques to solve different problems. Delve into the intricate details of these powerful tools as they reveal some of the hidden mysteries of the microscopic realm. From exploring the inner workings of cells to analyzing the composition of materials at the atomic level, this book offers an engaging and motivating journey into the realm of cutting-edge scientific exploration in electron microscopy and spectroscopy techniques with emerging trends in the field. Whether you are an experienced researcher or a curious enthusiast, this book will motivate your scientific thinking to discover and expand your understanding of the microscopic world, inviting you to continue working in these areas to obtain more interesting results.
Electron Energy-Loss Spectroscopy in the Electron Microscope
Author: R.F. Egerton
language: en
Publisher: Springer Science & Business Media
Release Date: 2013-03-09
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
Scanning Transmission Electron Microscopy
Author: Stephen J. Pennycook
language: en
Publisher: Springer Science & Business Media
Release Date: 2011-03-24
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.