Electrically Based Microstructural Characterization
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Electrically Based Microstructural Characterization II: Volume 500
Fifty papers from the December 1997 symposium which covered the application of electrical measurements for the detection of microstructural features at all length scales. In addition to the topics covered in the first symposium--dc and ad resistivity measurements, impedance/admittance analysis, multiplane analysis and various other methods such as electron energy loss spectroscopy, ellipsometry, and capacitance voltage measurements--there are several papers which combine electrical measurements with STM, AFM, NSOM and electroluminescence techniques so that more localized information may be obtainable. Annotation copyrighted by Book News, Inc., Portland, OR
Electrically Based Microstructural Characterization III: Volume 699
Among the topics of invited papers are the electrical characterization of inhomogeneous and heterogeneous systems with microstructural periodicity, impedance spectroscopy in ferromagnetic materials, the materials characterization and device performance of a CMR- ferroelectric heterostructure, and broadband dielectric spectroscopic investigations into the influence of confinement on the molecular reorientational dynamics of liquid crystals. Many papers besides the 48 selected here are expected to appear in various scientific journals. Annotation copyrighted by Book News, Inc., Portland, OR