Design Review Based On Failure Modes Drbfm And Design Review Based On Test Results Drbtr Process Guidebook

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Next Generation HALT and HASS

NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. Challenges existing failure prediction methodologies by highlighting their limitations using real field data. Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Effective FMEAs

Outlines the correct procedures for doing FMEAs and how to successfully apply them in design, development, manufacturing, and service applications There are a myriad of quality and reliability tools available to corporations worldwide, but the one that shows up consistently in company after company is Failure Mode and Effects Analysis (FMEA). Effective FMEAs takes the best practices from hundreds of companies and thousands of FMEA applications and presents streamlined procedures for veteran FMEA practitioners, novices, and everyone in between. Written from an applications viewpoint—with many examples, detailed case studies, study problems, and tips included—the book covers the most common types of FMEAs, including System FMEAs, Design FMEAs, Process FMEAs, Maintenance FMEAs, Software FMEAs, and others. It also presents chapters on Fault Tree Analysis, Design Review Based on Failure Mode (DRBFM), Reliability-Centered Maintenance (RCM), Hazard Analysis, and FMECA (which adds criticality analysis to FMEA). With extensive study problems and a companion Solutions Manual, this book is an ideal resource for academic curricula, as well as for applications in industry. In addition, Effective FMEAs covers: The basics of FMEAs and risk assessment How to apply key factors for effective FMEAs and prevent the most common errors What is needed to provide excellent FMEA facilitation Implementing a "best practice" FMEA process Everyone wants to support the accomplishment of safe and trouble-free products and processes while generating happy and loyal customers. This book will show readers how to use FMEA to anticipate and prevent problems, reduce costs, shorten product development times, and achieve safe and highly reliable products and processes.