Design Automation And Test In Europe
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Design, Automation, and Test in Europe
Author: Rudy Lauwereins
language: en
Publisher: Springer Science & Business Media
Release Date: 2008-01-08
In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
Design and Test Technology for Dependable Systems-on-Chip
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--