Coupled Electromagnetic Field Circuit Simulation Modeling And Numerical Analysis
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Coupled Electromagnetic Field/Circuit Simulation. Modeling and Numerical Analysis
Author: Sascha Baumanns
language: en
Publisher: Logos Verlag Berlin GmbH
Release Date: 2012
Today's most commonly used circuit models increasingly tend to lose their validity in circuit simulation due to rapid technological developments, miniaturization and increased complexity of integrated circuits. The starting point of this thesis was to tackle these challenges by refining the critical parts of the circuit by combining circuit simulation directly with distributed device models. The approach set out in this thesis couples partial differential equations for electromagnetic devices - modeled by Maxwell's equations -, to differential-algebraic equations, which describe basic circuit elements including memristors and the circuit's topology. First, Maxwell's equations are spatially discretized and a potential formulation is derived, the coupled system is then formulated as a differential-algebraic equation with a properly stated leading term and analyzed. Topological and modeling conditions are presented to guarantee the tractability index of these differential-algebraic equations to be no greater than two. Finally, local solvability, perturbation results and an algorithm to calculate consistent initializations are derived for a general class of differential-algebraic equations with a properly stated leading term having tractability index-2.
Mathematical Analysis and Simulation of Field Models in Accelerator Circuits
Author: Idoia Cortes Garcia
language: en
Publisher: Springer Nature
Release Date: 2021-01-04
This book deals with the analysis and development of numerical methods for the time-domain analysis of multiphysical effects in superconducting circuits of particle accelerator magnets. An important challenge is the simulation of “quenching”, i.e. the transition of a material from the superconducting to the normally electrically conductive state. The book analyses complex mathematical structures and presents models to simulate such quenching events in the context of generalized circuit elements. Furthermore, it proposes efficient parallelized algorithms with guaranteed convergence properties for the simulation of multiphysical problems. Spanning from theoretical concepts to applied research, and featuring rigorous mathematical presentations on one side, as well as simplified explanations of many complex issues, on the other side, this book provides graduate students and researchers with a comprehensive introduction on the state of the art and a source of inspiration for future research. Moreover, the proposed concepts and methods can be extended to the simulation of multiphysical phenomena in different application contexts.
Nanoelectronic Coupled Problems Solutions
Author: E. Jan W. ter Maten
language: en
Publisher: Springer Nature
Release Date: 2019-11-06
Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms’ industrial applicability.