Applied Scanning Probe Methods I


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Applied Scanning Probe Methods IV


Applied Scanning Probe Methods IV

Author: Bharat Bhushan

language: en

Publisher: Springer Science & Business Media

Release Date: 2006-04-28


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Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.

Applied Scanning Probe Methods X


Applied Scanning Probe Methods X

Author: Bharat Bhushan

language: en

Publisher: Springer Science & Business Media

Release Date: 2007-12-20


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The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Applied Scanning Probe Methods: Scanning probe microscopy techniques


Applied Scanning Probe Methods: Scanning probe microscopy techniques

Author:

language: en

Publisher:

Release Date: 2004


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