Ansi Esda Jedec Js 002 2025 Esda Jedec Joint Standard For Electrostatic Discharge Sensitivity Testing Charged Device Model Cdm Device Level

ANSI/ESDA/JEDEC JS-002-2025 - ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level

This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.

ANSI/ESDA/JEDEC JS-002-2022 ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level

ANSI/ESDA/JEDEC JS-001-2024 - ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Device Level

This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, acoustic wave devices, optoelectronic devices, hybrid integrated circuits (HICs), discrete, and multi-chip modules (MCMs) containing any of these devices as well as unpackaged singulated bare die, and die which are still part of a wafer are to be evaluated according to this standard.