An Introduction To Surface Analysis By Xps And Aes
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An Introduction to Surface Analysis by XPS and AES
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
An Introduction to Surface Analysis by XPS and AES.
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms.
Modern Techniques of Surface Science
Author: D. P. Woodruff
language: en
Publisher: Cambridge University Press
Release Date: 1994-03-03
This is a fully revised and expanded edition of a very successful and widely used book. It describes the physical basis of all the principal, and most of the more specialised, techniques currently employed in the study of well-characterised solid surfaces. The coverage of each technique, illustrated with selected examples, is underpinned by discussion of the relevant physical principles, and the complementary aspects of the various methods are also described. Throughout, the emphasis is on understanding the concepts involved, rather than on an exhaustive review of applications. The book will be of great use to final year undergraduate and postgraduate students in physics, chemistry and materials science. It will also be valuable to established researchers in any area of surface science concerned with the acquisition and analysis of experimental data.