Advances In Speckle Metrology And Related Techniques
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Advances in Speckle Metrology and Related Techniques
Author: Guillermo H. Kaufmann
language: en
Publisher: John Wiley & Sons
Release Date: 2011-01-25
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.
Digital Speckle Pattern Interferometry and Related Techniques
Author: Pramod K. Rastogi
language: en
Publisher: John Wiley & Sons
Release Date: 2001-02-08
Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.
Engineering Applications of Residual Stress, Volume 8
Author: Tom Proulx
language: en
Publisher: Springer Science & Business Media
Release Date: 2011-06-10
Engineering Applications of Residual Stress represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials, MEMS and Nanotechnology; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, and Thermomechanics and Infra-Red Imaging.