Advanced Mathematical And Computational Tools In Metrology Iv
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Advanced Mathematical And Computational Tools In Metrology Iv
Author: Patrizia Ciarlini
language: en
Publisher: World Scientific
Release Date: 2000-01-22
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Advanced Mathematical And Computational Tools In Metrology V
Author: Patrizia Ciarlini
language: en
Publisher: World Scientific
Release Date: 2001-03-09
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
Advanced Mathematical And Computational Tools In Metrology And Testing X
This volume contains original and refereed contributions from the tenth AMCTM Conference (www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.